Utilizing Macromodels in Floating Random Walk Based Capacitance Extraction for Nanometer Integrated CircuitsWenjian Yu
Department of Computer Science and Technology, Tsinghua University
Monday, May 23, 2016 10:00-11:00,
This talk is based on our recent paper which won the Best Paper Award on the Design, Automation and Test in Europe Conference (DATE’2016). In this talk, I will present the techniques that use macromodels in order to extend and improve the floating random walk (FRW) method for capacitance extraction. A macromodel is built for each sub-structure for which it is necessary or convenient to hide its geometry details during capacitance extraction. Then, a macromodel-aware random walk scheme connects the Markov-chain random walk inside the macromodels and the FRW outside through scalable blank patch regions. This method can be used for instance to extract capacitances for structure with encrypted sub-structures, and extend the FRW method’s capability for structure with complex geometry or repeated layout patterns. Numerical results validate the merits of the proposed method with structures including encrypted FinFET layout, complex geometry features, and cyclic layout patterns.
Speaker Bio: Dr. Wenjian Yu is an Associate Professor with the Department of Computer Science and Technology, Tsinghua University, Beijing, China. Dr. Yu's research mainly focuses on physical modeling and simulation of integrated circuits, and a broad range of numerical algorithms, stochastic algorithms and their parallelization. Dr. Yu has authored/coauthored two books and over 130 papers in refereed journals and conferences. He was the recipient of the distinguished Ph.D. Award from Tsinghua University in 2003, the Excellent Young Scholar Award from the National Science Foundation of China in 2014, and one Best Paper Award on DATE’2016, and three Best Paper Nominations in conferences ASPDAC and ISQED. Dr. Yu has been an IEEE senior member since 2010. Dr. Yu serves as an Associate Editor of IEEE Transactions on Computer Aided Design since 2016, and a Member of Editorial Board of the Scientific World Journal and Journal of Computer Aided Design and Computer Graphics since 2010. He also serves as a TPC member of international conferences including ICCAD, ASPDAC, SLIP, ICFPT, CSTIC, etc.
Contact: B. Cloteaux
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