ITLApplied  Computational Mathematics Division
ACMD Seminar Series
Attractive Image NIST

Advances in Coverage-Based Test Suite Reduction

Scott McMaster
University of Maryland, College Park

Friday, April 24, 2009 13:00-14:00,
Building 101, Lecture Room A
Friday, April 24, 2009 11:00-12:00,
Room 4550

Abstract: Modern software is increasingly developed using multi-language implementations, large supporting libraries and frameworks, callbacks, virtual function calls, reflection, multithreading, and object- and aspect-oriented programming. The predominant example of such software is the graphical user interface (GUI), which is used as a front-end to most of today's software applications. The characteristics of GUIs and other modern software present new challenges to software testing. Because recently developed techniques for automated test case generation can generate more tests than are practical to regularly execute, one important challenge is test suite reduction. Test suite reduction seeks to decrease the size of a test suite without overly compromising its original fault detection ability. This talk will present research that advances the state-of-the-art in test suite reduction by empirically studying a coverage criterion which considers the context in which program concepts are covered. The novel feature of this research is a technique based on the call stack coverage criterion which addresses many of the challenges associated with coverage-based test suite reduction in modern applications. Results show that reducing test suites while maintaining call stack coverage yields good tradeoffs between size reduction and fault detection effectiveness compared to traditional techniques. This talk will present models, metrics, algorithms, and techniques based upon this approach. Additionally, we will examine future research directions in the areas of coverage criteria, test case maintenance, and automated testing which will benefit the testing of GUI-intensive applications as well as other classes of software.

Speaker Bio: Scott McMaster received the B.S. degree in mathematics from the University of Nebraska, Lincoln, in 1994, master's degree in software engineering from Seattle University in 2001, and Ph.D. in computer science from the University of Maryland, College Park, in 2008. He has extensive industrial experience at startups as well as large companies including Microsoft, Lockheed Martin, and His research interests include software testing, program analysis, software tools, and distributed systems.

Presentation Slides: PDF

Contact: R. N. Kacker

Note: Visitors from outside NIST must contact Robin Bickel; (301) 975-3668; at least 24 hours in advance.

Privacy Policy | Disclaimer | FOIA
NIST is an agency of the U.S. Commerce Department.
Last updated: 2011-01-12.