In-Parameter-Order: A Test Generation Strategy for Pairwise Testing
Jeff (Yu) Lei
University of Texas at Arlington, Department of Computer Science and Engineering
Tuesday, June 21, 2005 16:00-17:00,
NIST North (820), Room 145
Gaithersburg
Tuesday, June 21, 2005 14:00-15:00,
Room 4511
Boulder
Abstract:
Pairwise testing (or 2-way testing) is a specification-based testing criterion which requires that for each pair of system parameters,
every combination of valid values of these two parameters be covered by at least one test case.
Empirical results show that pairwise testing is effective and practical for various types of software systems.
In this talk, we will describe a test generation strategy, called in-parameter-order (IPO), for pairwise testing.
For a system with two or more parameters, the IPO strategy generates a pairwise test set for the first two parameters,
extends the test set for the first three parameters, and continues to do so for each additional parameter.
The IPO strategy allows the reuse of existing tests when a system is extended with new parameters or new values of existing parameters.
We will present an IPO-based test generation tool and show some empirical results.
We will also discuss the challenges and opportunities to extend the IPO strategy to more than 2-way testing.
Speaker Bio:
Jeff Lei is currently an Assistant Professor in the Department of Computer Science and Engineering at the University of Texas at Arlington.
He received his PhD degree from North Carolina State University in 2002, his MS degree from the Chinese Academy of Sciences in 1996,
and his BS degree from Wuhan University, China, in 1993.
He was a member of the technical staff at Fujitsu Network Communications, Inc., from 1998 to 2001.
His current research is in the area of software analysis, testing, and verification, and is supported by a NASA IV&V grant.
Presentation Slides: PDF
Contact: R. N. KackerNote: Visitors from outside NIST must contact
Robin Bickel; (301) 975-3668;
at least 24 hours in advance.
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