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Approximating Limit Cycles of an Autonomous Delay Differential EquationDavid GilsinnInformation Technology Laboratory, Mathematical and Computational Sciences Division Tuesday, September 28, 2004 15:00-16:00, Speaker Bio: David E. Gilsinn is a Senior Mathematician with the Mathematical and Computational Sciences Division of the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, USA. He received the BS degree in Mathematics at Georgetown University in 1964, the MS degree in Mathematics at Rutgers--The State University in 1966, and the PhD degree in Mathematics at Georgetown University in 1969. From 1969 to 1970 he was a Senior Mathematician with Melpar, Inc., designing aircraft pilot performance measures. From 1970 to 2000 he was a Senior Mathematician with the Technical Analysis Division (abandoned by NIST in 1974), the precursor to ITL, the Institute for Computer Science and Technology (ICST), and MEL and its precursor CME at NIST doing applied research in multidiscipline areas from, for example, developing network flow algorithms to predict commodity and vehicle flows through networks to developing the NBS test programs to evaluate compliance of commercial implementations of BASIC with the ANSI and FIPS standard for BASIC. During his career with MEL he has developed algorithms for optical scattering problems, performed finite element analysis for the design of major structural components of high precision coordinate measuring machines, and developed statistical and analytical methods to analyze machine tool errors. His awards include The Applied Research Award, National Institute of Standards and Technology, Dec. 8, 1994 (Group Award) and the Department of Commerce Bronze Medal, Dec. 8, 1994 (Group Award). He joined MCSD in 2000 and has become involved with BFRL in developing algorithms for object recognition at construction sites. His main areas of research span the fields of dynamical systems, optimization, and image processing. He is the author or co-author of more than 50 technical articles and reports and is a member of Sigma Xi, SIAM, and ASME.
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