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SMTAPE: Original Harwell sparse matrix test collection

from the Harwell-Boeing Collection

Source: Harwell Laboratory, England.
Discipline: Variety of disciplines
Accession: Summer 1978

A collection of sparse matrices was begun by Curtis and Reid at Harwell in the early 1970's and was later extended by Duff into the present collection. These 36 matrices and matrix patterns come from a wide range of disciplines. A major objective of the test collection has been to represent important features of practical problems. Sparse matrix characteristics (such as average density of entries per row, pattern of the entries, symmetry, and matrix size) can differ among matrices arising from different disciplines. The test problems, though varying widely in their characteristics, have very distinctive patterns. For the symmetric matrices, we record only the entries on and below the diagonal.

Matrices in this set:

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Last change in this page: Wed Sep 22 13:33:53 US/Eastern 2004 [Comments: ]