ITLApplied  Computational Mathematics Division
ACMD Seminar Series
Attractive Image NIST

OOF2: Object-Oriented Finite Element Analysis of Material Microstructures

Stephen Langer
Information Technology Laboratory, Mathematical and Computational Sciences Division

Tuesday, January 11, 2005 15:00-16:00,
NIST North (820), Room 145
Tuesday, January 11, 2005 13:00-14:00,
Room 4550

Abstract: The physical properties of a material, such as its thermal conductivity or elasticity, often depend in detail on the material's microstructure: the complex arrangement of grains, phases, and pores that define the material's microscopic geometry. Knowledge of these physical properties is crucial to the development and application of new materials, but they can be difficult to measure directly. An alternative approach is to compute the properties, starting from an image of the microstructural geometry. The goal of the OOF (Object-Oriented Finite element) project at NIST is to provide a flexible and easily extensible tool for performing image-based simulations of microstructures. In this talk I will illustrate some of the applications of OOF1 and discuss the object-oriented design and benefits of the newly released OOF2.

Speaker Bio: Stephen A. Langer is a physicist in the Mathematical and Computational Sciences Division of the Information Technology Laboratory at the National Institute of Standards and Technology. He graduated from Princeton University in 1983 and earned his PhD in Physics at Cornell University in 1989. He was a post-doctoral fellow at the James Franck Institute at the University of Chicago and in the Physics Department at Simon Fraser University before joining NIST in 1994. He has worked on theories and simulations of liquid crystals, glasses, ferrofluids, biomembranes, and foams. He is the principal author of OOF, a program that uses image data and finite element analysis to analyze material microstructures. He received the NIST Jacob Rabinow Applied Research Award in 2000.

Presentation Slides: PDF

Contact: P. M. Ketcham

Note: Visitors from outside NIST must contact Robin Bickel; (301) 975-3668; at least 24 hours in advance.

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