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OOF2: Object-Oriented Finite Element Analysis of Material MicrostructuresStephen LangerInformation Technology Laboratory, Mathematical and Computational Sciences Division Tuesday, January 11, 2005 15:00-16:00, Speaker Bio: Stephen A. Langer is a physicist in the Mathematical and Computational Sciences Division of the Information Technology Laboratory at the National Institute of Standards and Technology. He graduated from Princeton University in 1983 and earned his PhD in Physics at Cornell University in 1989. He was a post-doctoral fellow at the James Franck Institute at the University of Chicago and in the Physics Department at Simon Fraser University before joining NIST in 1994. He has worked on theories and simulations of liquid crystals, glasses, ferrofluids, biomembranes, and foams. He is the principal author of OOF, a program that uses image data and finite element analysis to analyze material microstructures. He received the NIST Jacob Rabinow Applied Research Award in 2000.
Contact: P. M. Ketcham Note: Visitors from outside NIST must contact Robin Bickel; (301) 975-3668; at least 24 hours in advance. |