Emerging Devices and Materials for Beyond CMOSEric Vogel
Electronics and Electrical Engineering Laboratory, Semiconductor Electronics Division
Tuesday, October 5, 2004 15:00-16:00,
Speaker Bio: Eric M. Vogel is currently Group Leader of the CMOS and Novel Devices Group in the Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, NIST, and is Director of the NIST Advanced Measurement Laboratory Nanofabrication Facility. He received the PhD degree in 1998 in Electrical Engineering from North Carolina State University. His group performs research and development for the metrology, test structures, and reference materials required for CMOS and Beyond devices and their constituent materials. He has performed a broad range of research in MOS devices and gate dielectrics including electrical characterization, physical characterization, and reliability physics. He has published over 40 peer-reviewed papers, written 2 book chapters, and given over 20 invited presentations. He is currently Technical Chair of the Semiconductor Interface Specialists Conference, and on the technical committees of the Workshop on Dielectrics in Microelectronics and the International Reliability Physics Symposium. He is a member of the International Technology Roadmap for Semiconductors Emerging Research Materials working group, and an adjunct faculty member at North Carolina State University.
Contact: P. M. Ketcham
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