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This page is an abstract to the paper ``Refining the In-Parameter-Order Strategy for Constructing Covering Arrays'' by M. Forbes, J. Lawrence, Y. Lei, R. N. Kacker and D.R. Kuhn.
Covering arrays are structures for well-representing extremely large input spaces and are used to efficiently implement black-box testing for software and hardware. This paper proposes refinements over the In-Parameter-Order strategy (for arbitrary t). When constructing homogeneous-alphabet covering arrays, these refinements reduce runtime in nearly all cases by a factor of more than 5 and in some cases by factors as large as 280. This trend is increasing with the number of columns in the covering array. Moreover, the resulting covering arrays are about 5% smaller. Consequently, this new algorithm has constructed many covering arrays that are the smallest in the literature. A heuristic variant of the algorithm sometimes produces comparably sized covering arrays while running significantly faster.
R. C. Bryce and C. J. Colbourn, The density algorithm for pairwise interaction testing, Software Testing, Verification, and Reliability, To Appear.
Charlie J. Colbourn, Covering array tables, Accessed on July 2, 2007.
Donald E. Knuth, The art of computer programming, vol. 4, ch. 126.96.36.199, Addison-Wesley, 2005.
D. R. Kuhn and M. J. Reilly, An investigation of the applicability of design of experiments to software testing, Proceedings of the 27th NASA/IEEE Software Engineering Workshop, NASA Goddard Space Flight Center, December 2002.
Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun, and James Lawrence, IPOG: A general strategy for t-way software testing, ECBS '07: Proceedings of the 14th Annual IEEE International Conference and Workshops on the Engineering of Computer-Based Systems (Washington, DC, USA), IEEE Computer Society, 2007, pp. 549-556.
Y. Lei and K. C. Tai, In-parameter-order: a test generation strategy for pairwise testing, Proceedings of the Third IEEE International Conference on High-Assurance Systems Engineering Symposium, 1998, pp.254-261.
K. C. Tai and Y. Lei, A test generation strategy for pairwise testing, IEEE Transactions on Software Engineering 28 (2002), no. 1, 109-111.
Last Updated: 2008-01-30
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